We will show how large sensor data can be extracted automatically to scenarios using advanced AI technologies such as vision, sensor fusion, annotation tool, and generative AI. In addition, a process to transfer from simulation to hardware-in-the-loop (HiL) testing will be also discussed, focusing on auto calibration of control parameters and number of scenarios reduction.
Please feel free to join us in the presentation tomorrow or reach out at Siemens booth in the conference exposition: https://lnkd.in/eBQ_wwea